Services
-
In-situ Metallography (Replica Test)
-
SEM-EDS Analysis (BSE & SE detector)
-
Characterization of Materials
-
Gold Coating
-
Fractography Analysis
-
Failure / Root Cause Analysis (FA/RCA)
-
Remaining Life Assessment (RLA)
-
Risk Based Inspection (RBI)
-
Fitness For Services (FFS)
-
Micro structure Analysis Including Metallography Sample Preparation (Destructive)
-
Micro Hardness Testing (100 – 2000gmf)
-
Macro Etching
-
Carburization Testing
-
Passivation Test
-
Corrosion Testing (IGC, HIC, Pitting, Ferrite Content, Passivation, Corrosion Test)
-
Picking of Steel Billet Sample for defects findings
-
Chemical Analysis (Wet Chemical, Water, Oil & Mud Analysis, OES Metal Analysis, Ferrite Content test)
-
Mechanical Testing (TS, Hardness, Bend, Fracture, Peel test & YS)
-
High Temperature Creep Testing
-
General Chemistry & Microbiology Services
-
Welding Procedure Qualification (WQT)
Facilities
Micro structural Characterization
-
Field Microscope
-
Optical Microscope
-
Stereo Binocular Microscope
-
Scanning Electron Microscope
-
Field Microscope
Portable lightweight microscopes for hand-held field inspection of prepared surface and replicas. It provides up to 400x magnification.
Eye piece: 10x
Objective: 4x, 10x, 20x, 40x
Filter: Blue, Green
Analysis: Micro structural analysis onsite
Application
Field-proven and commonly used in boilers, heat exchangers and fin-fan tubes.
-
Optical Microscope
Eye piece: 10x
Objective: 5x, 10x, 20x, 50x, 100x
Filter: Blue, Green, Yellow
Analysis:Microstructural analysis, grain number, grain size, layer thickness measurement, inclusion etc.
-
Stereo Binocular Microscope
A stereo microscope provides a three-dimensional view of the specimen. It does this with separate objective lenses and eyepieces for each eye. They have lower magnification when compared to compound microscopes, but they also have a longer working distance and It uses for failure analysis & investigation of a component at low magnification on fracture surface to see the crack/failure initiation zone or other features.
-
Scanning Electron Microscope
Scanning electron microscope (SEM) is a versatile equipment which works on the principle of interactions of the electron beam with the atoms at various depths within the sample to produce the images. It produces various types of signals containing the information about the surface topography as well as the compositions of the sample.
Specificaion:
Accelerating Voltage: 0.5 to 30kV
Resolution: 3.0nm at 30kV,SEI
8.0nm at 3kV SEI
Signal: Secondary Electron Image (SEI)
Backscattered Electron Image (BSEI)
Magnification: 5x to 300000x based on the display size of 128mm x 96mm
Particle Characterization
-
Particle Size Analysis
-
Grain Size Measurement
-
Inclusion Rating
-
Carbide precipitation
-
Sigma phase counting